CITCOM presentation and attendance – SPIE Conference

From 14 – 18 April 2019 InnoTecUK attended and presented at the SPIE (Defense + Commercial Sensing Expo as partners of the EU H2020 funded CITCOM project.

SPIE is the international society for optics and photonics, founded in 1955 which advances emerging technologies through interdisciplinary information exchange, continuing education, publications, patent precedent, and career and professional growth.

Whilst at the SPIE conference in Baltimore, Professor Nico Avdelidis, Chief Operations Officer at InnoTecUK and member of the SPIE Conference Program Committee shared the CITCOM project presentation and literature with a wide range of industry partners and attendees from the defence, security, industry, health care, non-destructive inspection and environmental sectors interested in hearing the latest technical advancements in sensors, infrared technology, laser systems, spectral imaging and X—ray systems.










During the presentation Nico was able to share the development of the international research and innovation project, which aims to define an in—line inspection, measurement and control system for high reliability and detailed monitoring and inspection of MEMS, based on a 3D optical quality inspection system, robotic manipulation for sorting and non-focused 2d X-ray system.

More information regarding the conference can be found here;

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